The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2019
Filed:
Feb. 02, 2016
Applicant:
Pgs Geophysical As, Oslo, NO;
Inventors:
Grunde Rønholt, Olso, NO;
Nizar Chemingui, Houston, TX (US);
Alejandro Antonio Valenciano Mavilio, Houston, TX (US);
Shaoping Lu, Houston, TX (US);
Assignee:
PGS Geophysical AS, Oslo, NO;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/36 (2006.01); G01V 1/30 (2006.01); G01V 1/38 (2006.01); G01V 1/28 (2006.01);
U.S. Cl.
CPC ...
G01V 1/306 (2013.01); G01V 1/282 (2013.01); G01V 1/30 (2013.01); G01V 1/368 (2013.01); G01V 2210/632 (2013.01);
Abstract
Amplitude-versus-angle analysis for quantitative interpretation can include creation of a plurality of angle gathers from imaging a subsurface location with multiples in a near-offset range and imaging primaries outside the near-offset range and application of an amplitude-versus-angle analysis to the plurality of angle gathers to produce a quantitative interpretation pertaining to the subsurface location.