The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2019
Filed:
Oct. 07, 2015
Fujifilm Corporation, Tokyo, JP;
Mizuho Medi Co., Ltd., Saga, JP;
Kaori Shimada, Saga, JP;
Kenji Narahara, Saga, JP;
FUJIFILM CORPORATION, Tokyo, JP;
Abstract
Provided is an inspection kit that proper inspection can be performed even if a tester drips a remainder of sample. The inspection kit includes: a reagent device having a sample-dripping part, the reagent device being capable of making a sample dripped on the sample-dripping part flow in a first direction from an upstream side toward a downstream side; and a case surrounding the reagent device. A liquid-absorbing part is provided with a portion near the sample-dripping part of the case, the liquid-absorbing part guiding, according to capillary action, the remainder of the sample in a second direction differing from the first direction.