The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2019

Filed:

Aug. 11, 2014
Applicant:

Ukon Craft Science Ltd., Kyoto-shi, JP;

Inventor:

Juichiro Ukon, Kyoto, JP;

Assignee:

UKON Craft Science Ltd., Kyoto-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/65 (2006.01); G01N 30/74 (2006.01);
U.S. Cl.
CPC ...
G01N 21/658 (2013.01); G01N 30/74 (2013.01);
Abstract

It is problematic to provide a substrate for surface enhanced Raman scattering spectroscopy capable of being incorporated and used as a detector of a flow system such as a liquid chromatographic device, and a surface enhanced Raman scattering spectroscopy device and a liquid chromatographic device using same. The above problem is solved by providing a substrate body, pores formed penetrating said substrate body, and particles arranged on an exposed surface of said substrate body not to close the pores, and by an analyte being passed through said particles in-between and said pores.


Find Patent Forward Citations

Ukon, Juichiro. (2019). Substrate for surface enhanced raman scattering spectroscopy and devices using same (U.S. Patent No. 10359366). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10359366

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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