The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2019
Filed:
Feb. 25, 2014
Applicant:
Fuji Machine Mfg. Co., Ltd., Chiryu-shi, Aichi, JP;
Inventors:
Shinya Kumazaki, Chiryu, JP;
Kazuya Furukawa, Chiryu, JP;
Assignee:
FUJI MACHINE MFG. CO., LTD., Chiryu-shi, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/4065 (2006.01); B23Q 17/09 (2006.01); G01N 19/08 (2006.01); G01N 3/58 (2006.01);
U.S. Cl.
CPC ...
G01N 19/08 (2013.01); B23Q 17/0961 (2013.01); G01N 3/58 (2013.01); G05B 19/4065 (2013.01); G05B 2219/34464 (2013.01); G05B 2219/34465 (2013.01); G05B 2219/37076 (2013.01); G05B 2219/37342 (2013.01);
Abstract
A tool abnormality detection system corrects a monitoring range for a load on a tool in an Mcycle by using load data of at least one of 1to (M−1)cycles (where M is an integer of 2 or more), wherein processing work on a single workpiece corresponds to a single cycle, and the load data is data about the load on the tool in the cycle.