The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2019
Filed:
Jun. 20, 2014
Koninklijke Philips N.v., Eindhoven, NL;
Ajay Anand, Fishkill, NY (US);
Balasundar Iyyavu Raju, North Andover, MA (US);
Shriram Sethuraman, Briarcliff Manor, NY (US);
Junbo Li, Shanghai, CN;
John Petruzello, Carmel, NY (US);
Koninklijke Philips N.V., Eindhoven, NL;
Abstract
The invention relates to a temperature distribution measuring apparatus for measuring a temperature distribution within an object caused by heating the object. A temperature distribution measuring unit () measures the temperature distribution in a measurement region within the object, while the object is heated, and a temperature measurement control unit () controls the temperature distribution measuring unit such that the measurement region is modified depending on the measured temperature distribution, in order to measure different temperature distributions in different measurement regions. This allows, for example, modifying the measurement region depending on an actually measured temperature distribution such that in the modified new measurement region the measurement of the temperature of the object can be continued, if the temperature actually measured in the current measurement region is too high for being accurately measured, thereby extending the time period in which a temperature distribution of the object can be measured.