The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2019

Filed:

Oct. 15, 2015
Applicant:

Schlumberger Technology Corporation, Sugar Land, TX (US);

Inventors:

Kai Hsu, Sugar Land, TX (US);

Kentaro Indo, Sugar Land, TX (US);

Julian Pop, Houston, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
E21B 49/08 (2006.01); E21B 49/10 (2006.01); G01N 29/032 (2006.01); G01N 29/34 (2006.01); G01N 21/53 (2006.01);
U.S. Cl.
CPC ...
E21B 49/081 (2013.01); E21B 49/088 (2013.01); E21B 49/10 (2013.01); G01N 21/534 (2013.01); G01N 29/032 (2013.01); G01N 29/348 (2013.01);
Abstract

Obtaining in-situ, at a first time, first optical spectral data associated with a formation fluid flowing through a downhole formation fluid sampling apparatus, and then obtaining in-situ, at a second time after the first time, second optical spectral data associated with the formation fluid flowing through the downhole formation fluid sampling apparatus. A wavelength-independent scattering intensity within the formation fluid flowing through the downhole formation fluid sampling apparatus is then determined based on the first and second optical spectral data, and a wavelength-dependent scattering intensity within the formation fluid flowing through the downhole formation fluid sampling apparatus is determined based on the first and second optical spectral data.


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