The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2019
Filed:
Sep. 23, 2016
Honeywell Limited, Mississauga, CA;
Ning He, Edmonton, CA;
Xiaotao Liu, Edmonton, CA;
Michael Forbes, North Vancouver, CA;
Johan Backstrom, North Vancouver, CA;
Tongwen Chen, Edmonton, CA;
Honeywell Limited, Mississauga, CA;
Abstract
Automated parameter tuning techniques for cross-directional model predictive control for paper-making under user-specified parametric uncertainties to reduce variability of the actuator and measurement profiles in the spatial domain is proposed. Decoupling properties of the spatial and temporal frequency components permit separate controller design and parameter tuning. CD-MPC design that explicitly accounts for parametric model uncertainty while finding MPC cost function weighing matrices that prevent actuator picketing and guarantee robust stability of the spatial CD profile. Picketing refers to periodic variation patterns in the actuator array. The inventive technique includes: (i) determining the worst case cutoff frequency of all process models, given parametric uncertainty, (ii) designing a weighing matrix to penalize high frequency actuator variability based on the process model and worst case cutoff frequency, and (iii) finding a multiplier for the spatial frequency weighted actuator variability term in the MPC cost function that assures robust spatial stability.