The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2019

Filed:

Apr. 11, 2017
Applicant:

Okuma Corporation, Niwa-Gun, JP;

Inventors:

Tetsuya Matsushita, Niwa-Gun, JP;

Reiji Kanbe, Niwa-Gun, JP;

Assignee:

Okuma Corporation, Niwa-Gun, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23Q 17/22 (2006.01); G01B 5/008 (2006.01); B23Q 17/24 (2006.01);
U.S. Cl.
CPC ...
B23Q 17/2233 (2013.01); B23Q 17/2428 (2013.01); G01B 5/008 (2013.01);
Abstract

An error identification method includes a tool sensor position acquisition stage, a reference block position acquisition stage, a relative position calculation stage, a reference tool position acquisition stage, a position measurement sensor measurement stage, a length compensation value calculation stage, a diameter compensation value acquisition stage, a position measurement stage, a position compensation stage, and a geometric error identification stage. The diameter compensation value acquisition stage acquires a radial direction compensation value of the position measurement sensor with the measured jig. The position measurement stage indexes the rotation axis to a plurality of any given angles and measures respective positions of the measured jig. The position compensation stage compensates the position measurement value at the position measurement stage using the length direction compensation value and the radial direction compensation value. The geometric error identification stage identifies the geometric error from the plurality of position measurement values.


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