The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2019

Filed:

Aug. 21, 2015
Applicant:

Samsung Electronics Co., Ltd., Gyeonggi-do, KR;

Inventors:

Ibrahim Bechwati, Waltham, MA (US);

Eric Bailey, North Hampton, NH (US);

Geethika Weliwitigoda, Danvers, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
A61B 6/583 (2013.01); A61B 6/032 (2013.01); A61B 6/585 (2013.01);
Abstract

A method for calibrating detectors in a CT scanner, wherein the new calibration process uses a combination of slab-based and water-based calibrations. By combining both calibrations, the complexity of each procedure can be reduced which will reduce restrictions on the quality of detectors used in the scanner. The slabs can be made out of commercially available material such as acrylic, and they will require no special treatment. Combining both calibrations also reduces the number of water phantoms needed for the calibration and the complexity of the calibration algorithm. Furthermore, the slabs can be shaped based on the scanner geometry so as to optimize the slab-based calibration step.


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