The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2019
Filed:
Jul. 16, 2014
Sirona Dental Systems Gmbh, Bensheim, DE;
Kai Lindenberg, Wersau, DE;
Stefan Wundrak, Gronau, DE;
Sirona Dental Systems GMBH, Bensheim, DE;
Abstract
The invention relates to a method for capturing a three-dimensional x-ray image () of an object () by means of an x-ray system () comprising an x-ray source (), an x-ray detector () and a shutter matrix (), the shutter matrix () having a plurality of shutter elements (), the x-ray absorption properties of which are controllable. In the first method step, at least one region () to be captured of the object () is defined, wherein settings are planned for the individual shutter elements () of the shutter matrix () for different rotary positions (), taking into account the defined area () to be captured. Then, a plurality of two-dimensional x-ray images is captured from the planned rotary positions () during at least one partial rotation () using the planned settings of the shutter elements (), wherein the overall three-dimensional x-ray image () of the area () to be captured is generated from the individual two-dimensional x-ray images.