The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2019
Filed:
Oct. 06, 2017
Thomas Brunner, Nürnberg, DE;
Bernd Schreiber, Forchheim, DE;
Thomas Brunner, Nürnberg, DE;
Bernd Schreiber, Forchheim, DE;
Siemens Healthcare GmbH, Erlangen, DE;
Abstract
A method for determining a three-dimensional image dataset by an X-ray device is disclosed herein. The method includes recording projection images of an examination object from a plurality of recording angles, and reconstructing the image dataset from the projection images, wherein, for at least one examined projection image, in each case an interference condition is evaluated the fulfillment of which is dependent upon at least parts of the image data of the (respective) examined projection image and/or upon at least one parameter of the radiation source during the recording of the (respective) examined projection image and indicates that the (respective) examined projection image is a projection image with interference during the recording of which arcing has occurred in the radiation source. The method also includes disregarding at least one projection image with interference, or giving the projection image a lower weighting than all the projection images with no interference, or replacing the projection image with a synthetic projection image.