The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2019
Filed:
Jan. 07, 2015
Applicants:
Wan Y. Shih, Bryn Mawr, PA (US);
Wei-heng Shih, Bryn Mawr, PA (US);
Xin Xu, Philadelphia, PA (US);
Inventors:
Assignee:
DREXEL UNIVERSITY, Philadelphia, PA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61B 5/107 (2006.01);
U.S. Cl.
CPC ...
A61B 5/444 (2013.01); A61B 5/1075 (2013.01); A61B 2562/0247 (2013.01);
Abstract
An apparatus and method for determining the depth of an object below a surface or the thickness of the dermis. The apparatus and method use a plurality of piezoelectric fingers having probes with differently sized contact areas. A plurality of measurements is taken using each of the probes with differently sized contact areas in order to determine the depth of an object below a surface or the thickness of the dermis.