The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2019
Filed:
Apr. 30, 2015
Ohio State Innovation Foundation, Columbus, OH (US);
Institute of Psychology, Chinese Academy of Sciences, Beijing, CN;
Adaptive Sensory Technology, Boston, MA (US);
Beijing Juehua Medical Technology Co., Ltd., Beijing, CN;
Zhong-Lin Lu, Dublin, OH (US);
Chang-Bing Huang, Beijing, CN;
Wuli Jia, Beijing, CN;
Luis A. Lesmes, San Diego, CA (US);
Jiawei Zhou, Beijing, CN;
OHIO STATE INNOVATION FOUNDATION, Columbus, OH (US);
ADAPTIVE SENSORY TECHNOLOGY, Boston, MA (US);
BEIJING JUEHUA MEDICAL TECHNOLOGY CO., LTD., Beijing, CN;
INSTITUTE OF PSYCHOLOGY, CHINESE ACADEMY OF SCIENCES, Beijing, CN;
Abstract
Systems and methods for using an interocular inhibition procedure (IIP) for discriminating between anisometropic amblyopia and myopia, two disorders commonly confused in visual examination without proper optical correction. Opaque and translucent patching are positioned over the fellow (or untested) eye resulting in different contrast sensitivities in the amblyopic (or tested) eye. A pinhole aperture may be used for identifying amblyopia and myopia/hyperopia.