The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2019
Filed:
Mar. 25, 2016
Advanced Micro Devices, Inc., Sunnyvale, CA (US);
Samuel Lawrence Wasmundt, San Diego, CA (US);
Leonardo Piga, Austin, TX (US);
Indrani Paul, Round Rock, TX (US);
Wei Huang, Austin, TX (US);
Manish Arora, Dublin, CA (US);
Advanced Micro Devices, Inc., Santa Clara, CA (US);
Abstract
Systems, apparatuses, and methods for managing variations among nodes in parallel system frameworks. Sensor and performance data associated with the nodes of a multi-node cluster may be monitored to detect variations among the nodes. A variability metric may be calculated for each node of the cluster based on the sensor and performance data associated with the node. The variability metrics may then be used by a mapper to efficiently map tasks of a parallel application to the nodes of the cluster. In one embodiment, the mapper may assign the critical tasks of the parallel application to the nodes with the lowest variability metrics. In another embodiment, the hardware of the nodes may be reconfigured so as to reduce the node-to-node variability.