The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2019
Filed:
Mar. 08, 2018
Huawei Technologies Co., Ltd., Shenzhen, Guangdong, CN;
Ren Zheng, Shenzhen, CN;
Yining Wang, Shenzhen, CN;
HUAWEI TECHNOLOGIES CO., LTD., Shenzhen, CN;
Abstract
Embodiments of the present invention provide a delay measurement method and device. The method includes: determining a first delay of a first path; obtaining a first two-way delay of a first two-way path; obtaining a first one-way delay from a third IGW port to a provider/provider edge device; obtaining a second one-way delay from the provider/provider edge device to a first IGW port; determining a second delay, where the second delay is obtained by subtracting the first one-way delay and the second one-way delay from the first two-way delay; and comparing the first delay with the second delay. By means of the foregoing solutions, a one-way delay relationship between delays from the OTT server to different IGWs may be effectively determined, so as to determine a path whose one-way delay is optimal according to the one-way delay relationship.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile