The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2019
Filed:
Dec. 18, 2017
Applicant:
Fluke Corporation, Everett, WA (US);
Inventors:
Sena E. R. Janky, Sammamish, WA (US);
Glenn Keltto, Everett, WA (US);
Steve O' Hara, Poulsbo, WA (US);
J. David Schell, Austin, TX (US);
Elizabeth Bacon, Portland, OR (US);
Karen Jones, Portland, OR (US);
Assignee:
Fluke Corporation, Everett, WA (US);
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/26 (2006.01); H04B 10/071 (2013.01); H04L 12/24 (2006.01);
U.S. Cl.
CPC ...
H04L 43/0817 (2013.01); H04B 10/071 (2013.01); H04L 41/22 (2013.01); H04L 43/50 (2013.01);
Abstract
A test instrument provides suggested next operational step function to provide a user with assistance during testing. A display is provided to show the amount of a project that has been completed, for example as a percentage completed value. Individual test results may be saved to a 'fix later' list, which may be later accessed to re-test items that may not have passed on initial testing.