The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2019
Filed:
Jul. 13, 2016
Computational Systems, Inc., Knoxville, TN (US);
Christopher G. Hilemon, Knoxville, TN (US);
Anthony J. Hayzen, Knoxville, TN (US);
Thomas E. Nelson, Knoxville, TN (US);
Michael D. Medley, Knoxville, TN (US);
Computational Systems, Inc., Knoxville, TN (US);
Abstract
A machine monitoring system uses generically defined collection definitions, acquisition definitions, and measurement definitions to define machine data to be collected by machine monitoring devices and other data sources in a unified and device/source independent manner. Configuration software of the machine monitoring system defines data to be collected for a particular machine in such a manner that multiple different types of monitoring devices or data sources can each interpret the data definitions and provide the same type of data back to the software system. Thus, the data to be collected is defined once by the configuration software, and the data definition is interpreted internally by each monitoring device or data source. This greatly simplifies the monitoring system and provides the advantage that new monitoring devices can be added to the system to collect data without impacting the software configuration of the data required.