The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2019

Filed:

Mar. 17, 2017
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Inventors:

Yoo Jin Choi, San Diego, CA (US);

Dongwoon Bai, San Diego, CA (US);

Linbo Li, San Diego, CA (US);

Farrokh Etezadi, San Diego, CA (US);

Jungwon Lee, San Diego, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 1/10 (2006.01); H04B 17/336 (2015.01); H04L 27/148 (2006.01); H04L 27/10 (2006.01); H04B 17/21 (2015.01);
U.S. Cl.
CPC ...
H04B 17/336 (2015.01); H04B 17/21 (2015.01); H04L 27/10 (2013.01); H04L 27/148 (2013.01);
Abstract

A system and method for removing bias from a frequency estimate. A simulation is used to predict, for various values of the signal to noise ratio, a bias in a raw frequency estimate produced by a frequency estimation algorithm. A straight line is fit to simulated frequency offset estimates as a function of true frequency offset, and the reciprocal of the slope of the line is stored, as a multiplicative bias removal term, in a lookup table, for the simulated signal to noise ratio. In operation, the raw frequency estimate is multiplied by a multiplicative bias removal term, obtained from the lookup table, to form a corrected frequency offset estimate.


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