The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2019

Filed:

Jan. 30, 2018
Applicant:

Renesas Electronics Corporation, Tokyo, JP;

Inventors:

Satoshi Kura, Tokyo, JP;

Mitsuo Nissa, Tokyo, JP;

Keiji Sakamoto, Tokyo, JP;

Taichi Iwasaki, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/8234 (2006.01); H01L 27/088 (2006.01); H01L 27/108 (2006.01); H01L 49/02 (2006.01);
U.S. Cl.
CPC ...
H01L 27/088 (2013.01); H01L 21/823418 (2013.01); H01L 21/823437 (2013.01); H01L 21/823443 (2013.01); H01L 21/823456 (2013.01); H01L 27/10808 (2013.01); H01L 27/10814 (2013.01); H01L 27/10852 (2013.01); H01L 27/10894 (2013.01); H01L 27/10897 (2013.01); H01L 28/24 (2013.01);
Abstract

A first transistor required for decreasing leak current and a second transistor required for compatibility of high speed operation and low power consumption can be formed over an identical substrate and sufficient performance can be provided to the two types of the transistors respectively. Decrease in the leak current is required for the first transistor. Less power consumption and high speed operation are required for the second transistor. The upper surface of a portion of a substrate in which the second diffusion layer is formed is lower than the upper surface of a portion of the substrate where the first diffusion layer is formed.


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