The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2019

Filed:

Sep. 14, 2017
Applicant:

Topcon Corporation, Itabashi-ku, Tokyo, JP;

Inventors:

Naoki Morikawa, Tokyo, JP;

Tadayuki Ito, Tokyo, JP;

Assignee:

TOPCON CORPORATION, Itabashi-ku, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/00 (2011.01); G06T 19/00 (2011.01); G06T 19/20 (2011.01); G06T 7/285 (2017.01);
U.S. Cl.
CPC ...
G06T 19/003 (2013.01); G06T 7/285 (2017.01); G06T 15/005 (2013.01); G06T 19/20 (2013.01); G06T 2207/10012 (2013.01);
Abstract

A technique for facilitating understanding of a stereoscopic structure of an object in a 3-D image of point cloud data is provided. An image processing device includes a point cloud data display controlling unit, a marker display controlling unit, and a specified point cloud display controlling unit. The point cloud data display controlling unit displays a 3-D image of point cloud data on a screen. The marker display controlling unit displays a marker to specify a cut section of the 3-D image of the point cloud data. The specified point cloud display controlling unit displays a point cloud that constitutes the cut section among the point cloud data, as another image.


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