The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2019

Filed:

Apr. 05, 2017
Applicant:

University of Washington, Seattle, WA (US);

Inventors:

Ruikang K. Wang, Seattle, WA (US);

Chieh-Li Chen, Seattle, WA (US);

Zhongdi Chu, Seattle, WA (US);

Qinqin Zhang, Seattle, WA (US);

Assignee:

University of Washington, Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/62 (2017.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06T 7/62 (2017.01); G06T 2207/10101 (2013.01); G06T 2207/30101 (2013.01);
Abstract

A five-index quantitative analysis of OCT angiograms is disclosed. One method of analyzing an anatomical region of interest of a subject includes acquiring vascular image data from the region of interest and generating a binary vasculature map from the vascular image data. A vessel skeleton map and vessel perimeter map are generated from the binary vasculature map. Based on the three generated maps, a vessel area density, vessel skeleton density, vessel perimeter index, vessel diameter index, and vessel complexity can be determined, in addition to detection of any flow impairment zones in the region of interest. These metrics can be used to detect and assess vascular abnormalities from multiple perspectives.


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