The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2019

Filed:

Nov. 13, 2016
Applicant:

Vivotek Inc., New Taipei, TW;

Inventors:

Cheng-Chieh Liu, New Taipei, TW;

Wei-Ming Liu, New Taipei, TW;

Assignee:

VIVOTEK INC., New Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 3/40 (2006.01); H04N 5/232 (2006.01); H04N 5/247 (2006.01); H04N 7/18 (2006.01); G06T 7/33 (2017.01);
U.S. Cl.
CPC ...
G06T 3/4038 (2013.01); G06T 7/33 (2017.01); H04N 5/23238 (2013.01); H04N 5/247 (2013.01); H04N 7/181 (2013.01); G06T 2200/32 (2013.01); G06T 2207/30232 (2013.01);
Abstract

An image stitching method is applied to a camera system with an image stitching function, so as to combine monitoring images captured from different view angles. The camera system includes two image capturing units respectively having a first coordinate system and a second coordinate system, and monitoring regions of the two image capturing units are adjacent and include an overlapped monitoring region. The image stitching method includes detecting at least one moving object within the overlapped monitoring region, calculating at least one set of transforming parameters of the first coordinate system relative to the second coordinate system, acquiring a reliability level according to comparison result generated by mutual comparisons between several sets of transforming parameters and then further comparing with a threshold respectively, determining a final transform parameter by the reliability level, and utilizing the final transform parameter to stitch the monitoring images captured by the two image capturing units.


Find Patent Forward Citations

Loading…