The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2019
Filed:
Apr. 16, 2015
Hewlett-packard Development Company, L.p., Fort Collins, CO (US);
ENTIT SOFTWARE LLC, Sunnyvale, CA (US);
Abstract
A set of predicted binary quality indexes is created from a sample set of application lifecycle information and customer encountered defects (CED) for each module id and revision (rev) pair for each application. Normalized effort and quality related factors are extracted for each module id and rev pair of each application. A binary quality index is created based on a set of weighted CED ratings for each module id and rev pair of each application. A prediction model for the binary quality index is created by training a decision tree-based classifier with the sample set to create a set of prediction weights for each effort and quality factor. The set of prediction weights is applied to the effort and quality related factors to each module id and rev pair of an application under-development to create the set of predicted binary quality indexes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile