The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2019

Filed:

Sep. 02, 2016
Applicant:

Bae Systems Information and Electronic Systems Integration Inc., Nashua, NH (US);

Inventors:

Robert S Gray, Great Falls, VA (US);

Vu T Le, Chantilly, VA (US);

Robert B Ross, Fairfax, VA (US);

Gregory S Sadosuk, Fairfax, VA (US);

Michael J Weber, Warrenton, VA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 21/56 (2013.01); G06F 8/53 (2018.01); G06F 11/36 (2006.01); G06F 8/74 (2018.01);
U.S. Cl.
CPC ...
G06F 21/563 (2013.01); G06F 8/53 (2013.01); G06F 8/74 (2013.01); G06F 11/3636 (2013.01); G06F 2221/033 (2013.01);
Abstract

A Taint Modeling Function (TMF) finds abstract patterns and uses them to automate the malware detection process. TMF involves the process of statically analyzing a sequence of assembly language instructions and abstracting complex relationships among instruction inputs and outputs into a mathematical function containing a set of algebraic expressions. The set of expressions support fully automating semantic pattern detection in binary code. It deterministically generates outputs given inputs determining code block outputs, for given inputs, without executing the code. It detects code patterns automatically to spot bad coding patterns directly from the binary used to detect bugs statically in the entire application space.


Find Patent Forward Citations

Loading…