The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2019

Filed:

May. 22, 2017
Applicant:

Netapp, Inc., Sunnyvale, CA (US);

Inventors:

Alok Sharma, Bangalore, IN;

Satbir Singh, Bangalore, IN;

Sudhanshu Gupta, Bangalore, IN;

Assignee:

NetApp Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01); G06F 16/13 (2019.01); G06F 16/21 (2019.01); G06F 16/22 (2019.01); G06F 16/174 (2019.01);
U.S. Cl.
CPC ...
G06F 16/2255 (2019.01); G06F 16/137 (2019.01); G06F 16/1748 (2019.01); G06F 16/217 (2019.01); G06F 16/2246 (2019.01); G06F 3/0608 (2013.01); G06F 3/0641 (2013.01);
Abstract

Multiple key-value stores may be employed to smooth out random updates (based on the extent ID) to the EMAP database. The updates to the EMAP database occur in a two-stage manner: (i) using an append-only log store for the first stage and (ii) using an on-disk hash store for the second stage. The append-only log store is used to convert the random updates to sequential write operations on the EMAP database. Once full, the contents of the log store are sorted and moved to the on-disk hash store, which holds the updates for a transient period of time to enable batching of the updates. Once sufficient batching of the extent map entries are accumulated, those entries are sorted and moved to the EMAP database. Thereafter, the EMAP database can be scanned to find extent map entries having identical checksum bits to perform data deduplication.


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