The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2019

Filed:

Jul. 25, 2017
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Charan Srinivasan, San Jose, CA (US);

Eyal Gurgi, Petach Tikva, IL;

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/10 (2006.01); G06F 11/14 (2006.01); G06F 11/08 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1016 (2013.01); G06F 11/08 (2013.01); G06F 11/1076 (2013.01); G06F 11/1441 (2013.01); G06F 2201/805 (2013.01); G06F 2201/82 (2013.01);
Abstract

A storage system includes an interface and storage circuitry. The interface is configured to communicate with a plurality of memory cells coupled to multiple Bit Lines (BLs). The memory cells are programmed and read in sub-groups of multiple BLs, and the sub-groups correspond to respective addresses. The storage circuitry is configured to generate a sequence of addresses for reading memory cells that together store a data part and a pattern part containing a predefined pattern, via multiple respective sub-groups, to detect that the data part read from the memory cells is erroneous due to a fault that occurred in the sequence of addresses by identifying a mismatch between the pattern part read from the memory cells and the predefined pattern, and, in response to detecting the fault, to take a corrective measure to recover an error-free version of the data part.


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