The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2019

Filed:

Mar. 08, 2013
Applicant:

Insyde Software Corp., Taipei, TW;

Inventor:

David Edrich, Austin, TX (US);

Assignee:

Insyde Software Corp., Taipei, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0793 (2013.01); G06F 11/0706 (2013.01);
Abstract

A scalable method of determining in a firmware environment if the rate of occurrence of a detectable specified type of system event that occurs to a system component or discrete functional unit, has met a criteria with respect to a pre-selected threshold. When the meeting of the threshold criteria is detected, a previously defined action associated with the threshold criteria for the particular event can be invoked by the firmware. Embodiments may establish a sliding time-window that includes a currently detected type of system event and extends back a set duration in the past. Any occurrences of the specified event taking place earlier than the established time-window may be discarded while occurrences of the events during the specified time-window are added together with the newly detected event and compared to a threshold value to see if the threshold criteria has been met.


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