The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2019
Filed:
Jan. 13, 2016
Massachusetts Institute of Technology, Cambridge, MA (US);
Brian W. Anthony, Cambridge, MA (US);
Xian Du, Cambridge, MA (US);
Massachusetts Institute of Technology, Cambridge, MA (US);
Abstract
Described embodiments provide a method of generating an image of a region of interest of a target object. A plurality of concentric circular scan trajectories are determined to sample the region of interest. Each of the concentric circular scan trajectories have a radius incremented from an innermost concentric circular scan trajectory having a minimum radius to an outermost concentric circular scan trajectory having a maximum radius. A number of samples are determined for each of the concentric circular scan trajectories. A location of each sample is determined for each of the concentric circular scan trajectories. The locations of each sample are substantially uniformly distributed in a Cartesian coordinate system of the target object. The target object is iteratively rotated along each of the concentric circular scan trajectories and images are captured at the determined sample locations to generate a reconstructed image from the captured images.