The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2019
Filed:
Dec. 22, 2010
Bas Hulsken, Eindhoven, NL;
Sjoerd Stallinga, Delfgauw, NL;
Bas Hulsken, Eindhoven, NL;
Sjoerd Stallinga, Delfgauw, NL;
Koninklijke Philips N.V., Eindhoven, NL;
Abstract
This invention pertains to a method for microscopically imaging a sample, with a digital scanner comprising a sensor including a 2D array of pixels and to a digital scanning microscope carrying out this method. It is notably provided a method for microscopically imaging a sample with a scanner comprising a sensor including a 2D array of pixels in an XY coordinate system, the axis Y being substantially perpendicular to the scan direction, wherein the scanner is arranged such that the sensor can image an oblique cross section of the sample, and wherein the method comprises the steps of: • activating a first sub-array of the 2D array of pixels, the first sub-array extending mainly along the Y axis at a first X coordinate (X), • creating a first image by imaging a first area of the sample by means of the first sub-array of pixels. According to aspects of the invention, it is further proposed a scanner carryout this method and using the same 2D array sensor for imaging and auto-focusing purpose.