The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2019
Filed:
Apr. 28, 2017
Tsinghua University, Beijing, CN;
TSINGHUA UNIVERSITY, Beijing, CN;
Abstract
A phase microscopy system and method are provided in the present disclosure. The system includes: an optical source, configured to generate collimated light; an object arrangement component, configured to provide a mask and a sample; a microscopic imaging component, including a microscope and a sensor, the microscope being configured to project light that passes successively through the mask and the sample into the sensor to capture an image; and a control component, configured to reconstruct phase information of the sample based on the image through both the sample and the mash and a pre-stored reference image of the mask, in which the pre-stored reference image is pre-acquired by the phase microscopy system without providing the sample under a same light condition. With the present disclosure, dynamic phase information of the microscopic sample can be acquired accurately and rapidly with high resolution.