The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2019

Filed:

Aug. 21, 2008
Applicants:

William C. Sanstrom, Cypress, TX (US);

Roland E. Chemali, Humble, TX (US);

Inventors:

William C. Sanstrom, Cypress, TX (US);

Roland E. Chemali, Humble, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01V 11/00 (2006.01);
U.S. Cl.
CPC ...
G01V 11/00 (2013.01);
Abstract

Disclosed systems and methods provide automated log quality monitoring, thereby enabling fast, on-site determination of log quality by logging engineers as well as re-assurance to interpreters faced with geologically-improbable features in the logs. Such uses can provide early detection of logging issues, increase confidence in acquired logs, reduce unnecessary duplication of effort, and improve the reputation of the logging company. In at least some embodiments, log monitoring software applies a comparison function to axially-spaced (and/or azimuthally-spaced) sensors. The comparison function can be, inter alia, cross-correlation, mutual information, mean-square error, and ratio image uniformity, each of which can be determined as a function of a sliding window position to indicate regions wherein the log quality falls below a threshold value. It is not necessary for the log sensors to be of the same type, e.g., resistivity image sensors.


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