The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2019

Filed:

Apr. 01, 2014
Applicant:

Landmark Graphics Corporation, Houston, TX (US);

Inventors:

Nam X. Nguyen, Katy, TX (US);

Scott D. Senften, Sugar Land, TX (US);

Mary J. Cole, Houston, TX (US);

Assignee:

Landmark Graphics Corporation, Houston, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 1/34 (2006.01); G06T 17/05 (2011.01); G06T 15/40 (2011.01);
U.S. Cl.
CPC ...
G01V 1/34 (2013.01); G06T 15/405 (2013.01); G06T 17/05 (2013.01); G01V 1/345 (2013.01); G06T 2210/21 (2013.01);
Abstract

Method and system for 3-D imaging of subterranean geologic structures based on seismic data interpretations involves correcting mis-ties that arise as a result of orthogonal polylines failing to intersect due to inconsistencies in seismic interpretations. In some embodiments, the mis-ties may be corrected by adding a data point from one polyline at or near the mis-tie to the other polyline, and vice versa for the other polyline. The two data points are then adjusted so they coincide or merge. The merged data point is then used as intersection points for the polylines and associated with one another such that a change made to one intersection point is automatically made to the other intersection point. In some embodiments, one or more neighboring data points on each polyline are adjusted to smooth out the polyline at the point of the corrected mis-tie.


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