The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2019

Filed:

Jan. 20, 2017
Applicant:

Zeroplus Technology Co., Ltd., New Taipei, TW;

Inventors:

Chiu-Hao Cheng, New Taipei, TW;

Sung-Hui Lin, Taipei, TW;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3177 (2006.01); G01R 31/317 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3177 (2013.01); G01R 31/31723 (2013.01); G01R 31/31725 (2013.01); G06F 11/00 (2013.01);
Abstract

A logic analyzer includes a probe, an FPGA module, a first transmission interface, a storage module, and a second transmission interface. A method of retrieving data includes the following steps: retrieving a digital signal through the probe, integrating the digital signal into a piece of signal data through the FPGA module, retrieving the piece of signal data through the first transmission interface, saving the piece of signal data in the storage module through the first transmission interface with a first transmission rate, returning the piece of signal data saved in the storage module to the FPGA module through the first transmission interface, receiving and transmitting the piece of signal data to the computer through the second transmission interface with a second transmission rate, whereby to save the piece of signal data therein. A method of performance testing includes testing multiple objects to correspondingly generate a response time triggered by a digital signal, whereby to analyze the performance of the objects.


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Cheng, Chiu-Hao. (2019). Logic analyzer for evaluating an electronic product, method of retrieving data of the same, and method of performance testing (U.S. Patent No. 10352999). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10352999

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