The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2019

Filed:

Nov. 14, 2016
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Umesh Chandra, Santa Cruz, CA (US);

Timothy Thinh Mai, San Jose, CA (US);

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/20 (2006.01); G01R 31/317 (2006.01); G01R 31/319 (2006.01); G06F 11/00 (2006.01); G01R 31/3181 (2006.01); G01R 31/3177 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31703 (2013.01); G01R 31/3177 (2013.01); G01R 31/31708 (2013.01); G01R 31/31712 (2013.01); G01R 31/31716 (2013.01); G01R 31/31813 (2013.01); G01R 31/31907 (2013.01); G06F 11/00 (2013.01);
Abstract

A backplane testing system includes a test backplane coupled to a test device chassis and including a first connector system, a second connector system, and channels that connect the first connector system and the second connector system. A first test device in a first test device slot on the test device chassis engages the first connector system and provides a loop back circuit for the first connector system. A second test device in a second test device slot on the test device chassis engages the second connector system. The second test device sends a test signal through a channel on the test backplane such that the test signal is provided to the loop back circuit on the first test device and received back through the channel. The second test device analyzes the test signal that is received to determine a testing compliance of the channel on the test backplane.


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