The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10352990 B1

PDF
Full Text
Expired
Date of Patent:
Jul. 16, 2019

Filed:

Apr. 06, 2016
Applicant:

Kabushiki Kaisha Tokai Rika Denki Seisakusho, Aichi, JP;

Inventors:

Shinichi Miyazaki, Aichi, JP;

Tatsuya Suzuki, Aichi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/02 (2006.01); H02H 7/00 (2006.01); H02P 7/00 (2016.01); H02H 7/20 (2006.01); H02H 11/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/28 (2013.01); G01R 31/02 (2013.01); H02H 7/00 (2013.01); H02H 7/205 (2013.01); H02H 11/003 (2013.01); H02P 7/00 (2013.01);
Abstract

A failure diagnosis circuit configured to diagnose an open-circuit failure in a reverse connection protection transistor includes a power supply unit having a switching transistor electrically connected to a power source and the reverse connection protection transistor and is brought into an on state or an off state in response to a control signal, and in which power is supplied from the power source to the reverse connection protection transistor when the switching transistor is in the on state; a power supply control unit that controls power supply to the reverse connection protection transistor and stop of the power supply by outputting the control signal to the switching transistor; and a diagnosis unit that diagnoses an open-circuit failure in the reverse connection protection transistor on the basis of an output state of the control signal and a detection result of voltage between the switching transistor and the reverse connection protection transistor.


Find Patent Forward Citations

Miyazaki, Shinichi. (2019). Failure diagnosis circuit and failure diagnosis method (U.S. Patent No. 10352990). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10352990

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