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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10352950 B1

PDFFull Text
Date of Patent:
Jul. 16, 2019

Filed:

Sep. 09, 2016

Apparatus, method, and program for component measurement

Applicant:

Terumo Kabushiki Kaisha, Tokyo, JP;

Inventors:

Shouji Ochiai, Yamanashi, JP;

Takeyuki Moriuchi, Yamanashi, JP;

Masao Takinami, Yamanashi, JP;

Assignee:

TERUMO KABUSHIKI KAISHA, Tokyo, JP;

Attorneys:

Jason H. Vick

Sheridan Ross, PC

Primary Examiner:

Larry D Riggs, II

Int. Cl.
CPC ...
G01N 33/48 (2006.01); G01N 33/72 (2006.01); G01N 21/27 (2006.01); G01N 21/78 (2006.01); C12Q 1/54 (2006.01); G01N 21/31 (2006.01); G01N 21/35 (2014.01); G01N 33/66 (2006.01); G01N 21/84 (2006.01);
U.S. Cl.
CPC ...
G01N 33/721 (2013.01); C12Q 1/54 (2013.01); C12Y 101/03004 (2013.01); C12Y 111/01 (2013.01); G01N 21/27 (2013.01); G01N 21/274 (2013.01); G01N 21/31 (2013.01); G01N 21/35 (2013.01); G01N 21/78 (2013.01); G01N 21/783 (2013.01); G01N 33/66 (2013.01); G01N 21/8483 (2013.01); G01N 2201/061 (2013.01); G01N 2201/12 (2013.01); G01N 2333/805 (2013.01); G01N 2333/904 (2013.01); G01N 2333/908 (2013.01);
Abstract

Provided is a component measuring apparatus configured to determine a functional form that describes wavelength characteristics of a variation attributable to scattering (S (λ)). The apparatus then determines unknown one or more coefficients (p, q) based on a first relational expression that involves a variation attributable to absorption (H (λ)) and a group of second relational expressions that do not involve variations attributable to absorption (H (λ), H (λ), H (λ)). The apparatus then corrects an absorbance measured at an arbitrary wavelength (λ) using a function where the one or more coefficients (p, q) are applied to the functional form so as to reduce or eliminate at least the effects of scattering of light.

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