The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2019
Filed:
Sep. 28, 2017
Preloaded test substrates for testing lal-reactive substances, methods of use, and methods of making
Applicant:
General Electric Company, Schenectady, NY (US);
Inventors:
Richard Douglas Godec, Boulder, CO (US);
Paul Charles Melanson, Boulder, CO (US);
Matthew Kaddeland Stonesmith, Boulder, CO (US);
Hong Xu, Shanghai, CN;
Yan Huang, Shanghai, CN;
Assignee:
GENERAL ELECTRIC COMPANY, Schenectady, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/569 (2006.01); B01L 3/00 (2006.01); G01N 33/579 (2006.01); G01N 21/17 (2006.01);
U.S. Cl.
CPC ...
G01N 33/56911 (2013.01); B01L 3/5027 (2013.01); B01L 3/5085 (2013.01); B01L 3/502715 (2013.01); G01N 21/17 (2013.01); G01N 33/579 (2013.01); B01L 2200/0605 (2013.01); B01L 2200/0684 (2013.01); B01L 2300/021 (2013.01); B01L 2300/087 (2013.01); B01L 2300/0816 (2013.01); B01L 2300/0829 (2013.01); B01L 2300/0861 (2013.01); B01L 2300/0864 (2013.01); B01L 2300/0867 (2013.01); B01L 2300/16 (2013.01); B01L 2400/0406 (2013.01); B01L 2400/0409 (2013.01); B01L 2400/049 (2013.01); B01L 2400/0487 (2013.01); B01L 2400/0622 (2013.01); B01L 2400/0688 (2013.01); B01L 2400/0694 (2013.01); G01N 2400/10 (2013.01); G01N 2400/50 (2013.01); Y10T 436/2575 (2015.01);
Abstract
A test substrate for detecting a LAL-reactive substance, wherein at least a portion of said test substrate has been preloaded with at least one LAL reagent and/or at least one LAL-reactive standard. Methods of use of the test substrate are disclosed. Methods of depositing test reagents on a test substrate are also disclosed.