The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2019
Filed:
Oct. 16, 2015
Applicant:
Christopher Gordon Atwood, San Diego, CA (US);
Inventor:
Christopher Gordon Atwood, San Diego, CA (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); G01N 27/74 (2006.01); G01N 33/58 (2006.01); G01N 33/542 (2006.01); G01N 33/543 (2006.01); G01N 33/558 (2006.01);
U.S. Cl.
CPC ...
G01N 33/558 (2013.01); G01N 21/648 (2013.01); G01N 21/6428 (2013.01); G01N 21/6445 (2013.01); G01N 33/542 (2013.01); G01N 33/54326 (2013.01); G01N 33/582 (2013.01); G01N 27/745 (2013.01); G01N 2021/6439 (2013.01); G01N 2021/6463 (2013.01);
Abstract
In one aspect, presence and/or level of an analyte within a sample is determined by use of a construct comprising a magnetic moiety and a fluorescent moiety. In one embodiment, the construct is magnetically migrated to a transparent surface and then dragged along the surface. In one aspect, an evanescent field is applied and changes in the diffusional or rotational properties of the fluorescent moiety as it migrates in and out of the evanescent field are measured by changes in its fluorescent emission, providing a measure of the interaction between the construct and a component of the sample.