The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2019

Filed:

Aug. 11, 2015
Applicant:

Robert Bosch Gmbh, Stuttgart, DE;

Inventors:

Reiner Krapf, Filderstadt, DE;

Felix Kurz, Steinheim, DE;

Assignee:

Robert Bosch GmbH, Stuttgart, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); G01N 24/08 (2006.01); G01R 33/38 (2006.01); G01S 15/02 (2006.01); G01S 13/02 (2006.01); G01S 13/86 (2006.01); G01S 13/88 (2006.01); G01S 15/88 (2006.01); G01R 33/34 (2006.01);
U.S. Cl.
CPC ...
G01N 24/082 (2013.01); G01N 24/08 (2013.01); G01N 24/081 (2013.01); G01R 33/34007 (2013.01); G01R 33/3808 (2013.01); G01S 13/0209 (2013.01); G01S 13/86 (2013.01); G01S 13/88 (2013.01); G01S 15/025 (2013.01); G01S 15/88 (2013.01);
Abstract

A mobile measuring apparatus for nondestructively determining a material measurement value that relates to a material property of a workpiece comprises a housing in which at least a first sensor device and a second sensor device are located, a control device, an evaluating device, and a device for the supply of energy to the measuring apparatus. The first sensor device has a nuclear magnetic resonance sensor and the second sensor device has a sensor based on dielectric and/or resistive methods. Information about the material property of the workpiece, in particular moisture present in the workpiece, is obtained by evaluating a measurement signal provided by the first sensor device, which information is intended for the optimized control of the second sensor device and/or optimized evaluation of measurement signals provided by the second sensor device.


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