The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2019
Filed:
Jun. 25, 2015
Applicant:
Commissariat a L'energie Atomique ET Aux Energies Alternatives, Paris, FR;
Inventors:
Caroline Paulus, Grenoble, FR;
Joachim Tabary, Grenoble, FR;
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/20 (2018.01); G01N 23/201 (2018.01); G01N 23/087 (2018.01); G01N 23/207 (2018.01);
U.S. Cl.
CPC ...
G01N 23/20083 (2013.01); G01N 23/087 (2013.01); G01N 23/201 (2013.01); G01N 23/2076 (2013.01); G01N 2223/04 (2013.01); G01N 2223/045 (2013.01); G01N 2223/304 (2013.01); G01N 2223/3037 (2013.01); G01N 2223/316 (2013.01); G01N 2223/50 (2013.01);
Abstract
A method for analyzing an object includes irradiating the object with incident photon radiation and acquiring an energy spectrum scattered by the material using a spectrometric detector in scatter mode. An energy spectrum transmitted by the material is acquired using a spectrometric detector in transmission mode. A signature (f) is reconstructed representing the object, both from the scatter spectrum measured and from the transmission spectrum measured, and the reconstructed signature thereof is compared with signatures of standard materials.