The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2019
Filed:
Dec. 27, 2016
Applicant:
Malvern Panalytical B.v., Almelo, NL;
Inventors:
Milen Gateshki, Almelo, NL;
Detlef Beckers, Almelo, NL;
Assignee:
MALVERN PANALYTICAL B.V., Almelo, NL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/046 (2018.01);
U.S. Cl.
CPC ...
G01N 23/046 (2013.01); G01N 2223/309 (2013.01); G01N 2223/419 (2013.01); G01N 2223/501 (2013.01);
Abstract
Apparatus for computed tomography is described that is also suitable for X-ray diffraction. The computed tomography measurement uses a line focusand passes the X-rays from the line focus through a perpendicular slitand then through a sample onto a two dimensional detector. A plurality of images are taken, each with the sample rotated about a rotation axisby a different amount, and combined to create a computed tomography image.