The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2019

Filed:

Nov. 21, 2017
Applicant:

Alakai Defense Systems, Inc., Largo, FL (US);

Inventors:

Kenneth R. Pohl, Clearwater, FL (US);

Christopher Neglia, Largo, FL (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/65 (2006.01);
U.S. Cl.
CPC ...
G01N 21/65 (2013.01); G01N 2201/061 (2013.01); G01N 2201/064 (2013.01);
Abstract

The present invention comprises a novel approach for optimizing detection performance of a standoff optical detection system using the inelastic scattering of light from the target and/or inelastic scattering of light from molecules between the light emitting source and the target. This is a useful approach primarily for systems which already employ a pulsed light source, a detector, and a timing mechanism but whose primary function is not the detection of range. Using this methodology removes the need to deploy a secondary device to find range or augments the ability of any included range finder to widen the overall system operating envelope, reliability, and performance.


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