The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2019
Filed:
Mar. 30, 2017
Applicant:
Applied Photophysics Ltd., Leatherhead, GB;
Inventor:
Nigel Thornton Hopley White, Dorking, GB;
Assignee:
APPLIED PHOTOPHYSICS LTD., Leatherhead, GB;
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/19 (2006.01); G01N 21/27 (2006.01); G01N 21/17 (2006.01); G01N 21/21 (2006.01);
U.S. Cl.
CPC ...
G01N 21/19 (2013.01); G01N 21/274 (2013.01); G01N 21/17 (2013.01); G01N 21/21 (2013.01);
Abstract
This invention relates to a device for calibrating circular or linear dichroism spectrometers, or other photoelastic modulator (PEM) based devices or instruments. In preferred embodiments, the present invention features a device for calibrating circular dichroism or linear dichroism spectrometers comprising at least one waveplate (Q) providing (n±¼) waves of retardation at a defined set of wavelengths, and at least one isotropic plate (P). The invention also features methods for using the device, for example, for calibrating circular dichroism spectrometers or linear dichroism spectrometers.