The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2019
Filed:
Oct. 17, 2014
Kyoto University, Kyoto-shi, Kyoto, JP;
Hamamatsu Photonics K.k., Hamamatsu-shi, Shizuoka, JP;
Norio Nakatsuji, Kyoto, JP;
Norikazu Sugiyama, Hamamatsu, JP;
Yoshinori Mizuguchi, Hamamatsu, JP;
Tadashi Fukami, Hamamatsu, JP;
Hidenao Yamada, Hamamatsu, JP;
Toyohiko Yamauchi, Hamamatsu, JP;
Yumi Kakuno, Hamamatsu, JP;
KYOTO UNIVERSITY, Kyoto-shi, JP;
HAMAMATSU PHOTONICS K.K., Hamamatsu-shi, Shizuoka, JP;
Abstract
The present invention relates to a cell assessment method characterized in including an acquisition step of acquiring an optical path length image of a small cell clump, an extraction step of extracting a cell nucleus region within the acquired optical path length image, a comparison step of comparing an optical path length of an inside and an optical path length of an outside of the extracted cell nucleus region, and an assessment step of assessing whether or not a cell is a stem cell based on the comparison results.