The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2019

Filed:

Dec. 12, 2014
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Xun Yu, Shanghai, CN;

Ran Li, Shanghai, CN;

Assignee:

GENERAL ELECTRIC COMPANY, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 17/10 (2006.01); B61K 9/12 (2006.01); G01N 29/04 (2006.01); G01N 29/24 (2006.01);
U.S. Cl.
CPC ...
G01M 17/10 (2013.01); B61K 9/12 (2013.01); G01N 29/041 (2013.01); G01N 29/24 (2013.01); G01N 2291/0289 (2013.01); G01N 2291/106 (2013.01); G01N 2291/2696 (2013.01);
Abstract

The present invention discloses a inspection device for detecting a defect of a metal object, where the inspection device includes a main base, at least one main magnetic module, and a main inspection module. The at least one main magnetic module is installed on the main base, for attaching the main base onto the metal object under an action of a magnetic force. The main inspection module is installed on the main base, to detect at least one type of defect of the metal object. The present invention further discloses a wheel defect inspection method and a wheel defect inspection device. The metal object defect inspection device may implement automatic detection of a defect on a whole circumference of a wheel.


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