The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2019
Filed:
Apr. 15, 2016
Infineon Technologies Ag, Neubiberg, DE;
Dirk Hammerschmidt, Villach, AT;
Friedrich Rasbornig, Klagenfurt, AT;
Michael Strasser, Villach, AT;
Infineon Technologies AG, Neubiberg, DE;
Abstract
A circuit, a method, and a computer program configured to detect mechanical stress and a circuit, a method, and a computer program configured to monitor safety of a system is disclosed. The detection circuit is configured to monitor a mechanical stress level of a semiconductor circuit. The detection circuit includes a stress monitor circuit configured to monitor a signal comprising mechanical stress level information of the semiconductor circuit, a reference circuit to generate a reference signal, and a calibration circuit configured to modify at least one of the stress signal or the reference signal based on calibration information for the semiconductor circuit to obtain a at least one modified signal. The detection circuit further includes an activation signal generator configured to generate an activation signal including activation information related to the mechanical stress level of the semiconductor circuit depending on a relation between the modified signal, and the stress signal or the reference signal.