The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2019
Filed:
Jun. 18, 2015
Sharp Laboratories of America, Inc., Camas, WA (US);
Bryan Severt Hallberg, Vancouver, WA (US);
Sharp Laboratories of America, Inc., Vancouver, WA (US);
Abstract
A sensor calibration method and system dynamically compute a bias offset which is subtracted from field strength readings generated by a sensor to correct them. The three-dimensional space around a sensor is seeded with orientation targets. As the sensor is rotated to different orientations, field strength readings are generated by the sensor and assigned to different targets based on estimated proximity. Once occupancy of targets conforms to a first state of occupancy, a coarse bias offset is computed for the sensor using readings from occupied targets. Once occupancy of targets conforms to a second state of occupancy, a refined bias offset is computed for the sensor using readings from occupied targets. Multiple sensors may be calibrated concurrently. Moreover, a user interface provides a real-time graphic showing the location and occupancy status of individual targets and highlighting the individual target best aligned with a most recent corrected sensor reading.