The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2019
Filed:
Mar. 03, 2016
Applicant:
Leica Geosystems Ag, Heerbrugg, CH;
Inventor:
Ulrich Hornung, St. Gallen, CH;
Assignee:
LEICA GEOSYSTEMS AG, Heerbrugg, CH;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 15/00 (2006.01); G01S 3/786 (2006.01); G01S 17/42 (2006.01); G01S 17/66 (2006.01); G01S 7/486 (2006.01);
U.S. Cl.
CPC ...
G01C 15/002 (2013.01); G01S 7/4868 (2013.01); G01S 17/42 (2013.01); G01S 17/66 (2013.01);
Abstract
Measuring device with a control and evaluation unit, a radiation source for emitting an illumination light ray and a fine targeting and target tracking functionality, a variation of the emission of the illumination light ray being effected automatically controlled by the control and evaluation unit, in the course of the fine targeting and target tracking functionality, such that a known sequence of illumination ray flashes is generated.