The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2019
Filed:
Mar. 16, 2017
Applicant:
Hexagon Metrology, Inc., North Kingstown, RI (US);
Inventors:
Gurpreet Singh, Providence, RI (US);
Paul Racine, Providence, RI (US);
John Langlais, Coventry, RI (US);
Jie Zheng, Mansfield, MA (US);
Assignee:
Hexagon Metrology, Inc., North Kingstown, RI (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/00 (2006.01); G01B 21/04 (2006.01); F16B 2/20 (2006.01);
U.S. Cl.
CPC ...
F16B 2/20 (2013.01); G01B 11/005 (2013.01); G01B 11/007 (2013.01); G01B 21/047 (2013.01);
Abstract
A probe clip allows easy and accurate placement of a probe clip onto a coordinate measuring machine ('CMM'). Moreover various probe clips are configured to movably and adjustably secure an optical probe to the CMM. To that end, the probe clip may have a probe seat, for holding the probe, movably coupled to a clamp segment by an adjustable joint. The clamp segment movably couples the probe seat to a probe platform on the CMM.