The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2019
Filed:
Mar. 16, 2015
Tohoku University, Sendai-shi, Miyagi, JP;
Furukawa Techno Material Co., Ltd., Hiratsuka-shi, Kanagawa, JP;
Furukawa Electric Co., Ltd., Tokyo, JP;
Toshihiro Omori, Sendai, JP;
Shingo Kawata, Sendai, JP;
Ryosuke Kainuma, Sendai, JP;
Kiyohito Ishida, Sendai, JP;
Toyonobu Tanaka, Hiratsuka, JP;
Kenji Nakamizo, Hiratsuka, JP;
Sumio Kise, Hiratsuka, JP;
Koji Ishikawa, Hiratsuka, JP;
Misato Nakano, Tokyo, JP;
Satoshi Teshigawara, Tokyo, JP;
TOHOKU UNIVERSITY, Sendai-Shi, Miyagi, JP;
FURUKAWA TECHNO MATERIAL CO., LTD., Hiratsuka-Shi, Kanagawa, JP;
FURUKAWA ELECTRIC CO., LTD., Tokyo, JP;
Abstract
A Cu—Al—Mn-based alloy having superelastic characteristics and having a recrystallized texture substantially formed of a β single phase, in which 70% or more of crystal grains is within a range of 0° to 50° in a deviation angle from <001> orientation of a crystalline orientation measured in a working direction by electron back-scatter diffraction patterning.